Neural analysis pictures are used in many fields of science and utilitarian areas by increasing number of followers. Artificial neural networks work best in cases where one cannot use structural knowledge, be they math formulas. There is an increasing load of data that requires processing. Therefore a need for development of intelligent computers to compile such data has appeared. The very aim of this paper is to classify X-rays of wheat grains in order to create new computer applications. The aforementioned computer applications are applied in theprocess of analysis and classification ofX-rays ofwheat grains. This system has been developed and devised in Microsoft Visual Studio 2008 with NET 3.5 Framework. The inter-face has been set in the RENZIAR 1.0 Program, which is very specific, but not complicated, and therefore should not cause anyproblems to its users.